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  1.  13
    Demagnetization factors of the general ellipsoid: An alternative to the Maxwell approach.M. Beleggia, M. De Graef & Y. Millev - 2006 - Philosophical Magazine 86 (16):2451-2466.
  2.  13
    Transmission electron microscopy study of complex planar faults in Ru–Al–0.5 at.% B.D. -C. Lu, M. De Graef & T. M. Pollock † - 2004 - Philosophical Magazine 84 (22):2317-2329.
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  3.  16
    Systematic row and zone axis STEM defect image simulations.P. J. Phillips, M. J. Mills & M. De Graef - 2011 - Philosophical Magazine 91 (16):2081-2101.
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  4.  17
    Grain-scale strain mapping for analysis of slip activity in polycrystalline B2 RuAl.A. Wu, M. De Graef & T. M. Pollock - 2006 - Philosophical Magazine 86 (25-26):3995-4008.
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